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DHR/AR Rheometer: Setting Up an Oscillation Fast Sampling Test

In this topic
Overview
Test Setup

Overview

In an Oscillation Fast Sampling experiment, a sinusoidal strain is applied to the sample while the measured torque and angular displacement signals are collected in a continuous buffer and correlated at a rate of up to 100 times per second, independent of the selected test frequency. The size of the buffer is defined by the number of cycles set for the data acquisition. Although the correlation rate is independent of the excitation frequency, the correlation rate should be set to allow at least 20% renewal of the buffer content for each consecutive correlation. Since one data point averages at least 1/2 of a cycle, the test frequency has to be selected such that the oscillation period is much smaller than the duration of the reaction process. AutoStrain is not active during fast sampling experiments.

Typical applications are fast curing processes such as UV curing or fast structure recoveries after previous shearing.

Test Setup 

To select an Oscillation Fast Sampling test, see Using Experimental Procedures for detailed instructions.

When you perform an Oscillation Fast Sampling test, the following parameters need to be chosen.

Environmental Control

Select the following environmental control parameters after choosing between Isothermal or Ramp control:

Isothermal control

Ramp control

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Test Parameters

Set up the following test parameters.

  1. Select between Torque, Stress, Displacement, Strain, or Strain%. This test can be run using either torque/stress or displacement/strain as the controlling variable.
  1. Enter the desired Single point frequency:

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Data Acquisition

There are additional data collection options that can be adjusted to control how data is obtained and what additional information is collected during the measurement. To access these options, click the Data acquisition drop-down arrow. 

  1. Correlation Parameters: These options control how data is sampled for use in the dynamic mechanical correlation used to generate the oscillatory data. These settings are typically used to modify the amount of time for the sample to reach steady state oscillation, and to control the amount of raw data sampled for use in the correlation.

Both Delay cycles and Delay time are used to specify the amount of time used to reach steady state at each measurement. If both Cycles and Time are specified, the shorter of the two time periods is used. This can be particularly useful in the case of a frequency sweep, where, at low frequencies (with very long cycle periods) the delay is determined by the delay cycles, but at higher frequencies the delay can be based on the delay time.

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